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    In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper

    New search for: Couzinie, J. P.
    New search for: Decamps, B.
    New search for: Boulanger, L.
    New search for: Priester, L.

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    In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper

    New search for: Couzinie, J. P.
    New search for: Decamps, B.
    New search for: Boulanger, L.
    New search for: Priester, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper

    New search for: Couzinie, J. P.
    New search for: Decamps, B.
    New search for: Boulanger, L.
    New search for: Priester, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    In-situ transmission electron microscopy study of glissile grain boundary dislocation relaxation in a near =3{111} grain boundary in copper

    Contributors:

    Couzinie, J. P. (author) / Decamps, B. (author) / Boulanger, L. (author) / Priester, L. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING A ; 400-401 ; 264-267

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0921-5093

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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