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Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate
Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate
Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate
Pecharapa, W. (Autor:in) / Keawprajak, A. (Autor:in) / Kayunkid, N. (Autor:in) / Rahong, S. (Autor:in) / Yindeesuk, W. (Autor:in) / Nukeaw, J. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 123 ; 163-166
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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