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    Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate

    New search for: Pecharapa, W.
    New search for: Keawprajak, A.
    New search for: Kayunkid, N.
    New search for: Rahong, S.
    New search for: Yindeesuk, W.
    New search for: Nukeaw, J.

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    Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate

    New search for: Pecharapa, W.
    New search for: Keawprajak, A.
    New search for: Kayunkid, N.
    New search for: Rahong, S.
    New search for: Yindeesuk, W.
    New search for: Nukeaw, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate

    New search for: Pecharapa, W.
    New search for: Keawprajak, A.
    New search for: Kayunkid, N.
    New search for: Rahong, S.
    New search for: Yindeesuk, W.
    New search for: Nukeaw, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Electroreflectance and photocurrent measurement of ZnSe/Alq3/TPD heterostructure on Si-substrate

    Contributors:

    Pecharapa, W. (author) / Keawprajak, A. (author) / Kayunkid, N. (author) / Rahong, S. (author) / Yindeesuk, W. (author) / Nukeaw, J. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 123 ; 163-166

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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