Chemically Induced Interface Migration

Yoon, D. Y. | British Library Online Contents | 1996

Ultra-thin silicon oxide layers on crystalline silicon wafers: Comparison of advanced oxidation techniques with respect to chemically abrupt SiO2/Si interfaces with low defect densities

Stegemann, Bert / Gad, Karim M. / Balamou, Patrice et al. | British Library Online Contents | 2017

Ultra-thin silicon oxide layers on crystalline silicon wafers: Comparison of advanced oxidation techniques with respect to chemically abrupt SiO2/Si interfaces with low defect densities

Stegemann, Bert / Gad, Karim M. / Balamou, Patrice et al. | British Library Online Contents | 2017

Chemically deposited copper oxide thin films: structural, optical and electrical characteristics

Nair, M.T.S. / Guerrero, L. / Arenas, O.L. et al. | British Library Online Contents | 1999

Crystal orientation and near-interface structure of chemically vapor deposited MoS~2 films

Lee, W. Y. et al. | British Library Online Contents | 1995