Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Precise determination of extended dislocation boundary plane in transmission electron microscopy
Huang, X. (Autor:in)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 21 ; 1379-1382
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy
British Library Online Contents | 2012
|British Library Online Contents | 2013
|British Library Online Contents | 2005
|Transmission electron microscopy study of dislocation motion in icosahedral Al-Pd-Mn
British Library Online Contents | 2005
|Dislocation analysis of a Mg—Al—Ca alloy by transmission electron microscopy
British Library Online Contents | 2018
|