Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Positron beam studies of transients in semiconductors
Positron beam studies of transients in semiconductors
Positron beam studies of transients in semiconductors
Beling, C. D. (Autor:in) / Ling, C. C. (Autor:in) / Cheung, C. K. (Autor:in) / Naik, P. S. (Autor:in) / Zhang, J. D. (Autor:in) / Fung, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 3172-3182
01.01.2006
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Positron Beam Studies of Defects in Semiconductors
British Library Online Contents | 2001
|Positron beam studies of cobalt silicides
British Library Online Contents | 2008
|Positron annihilation studies of mesoporous silica films using a slow positron beam
British Library Online Contents | 2006
|Positron energy levels in narrow gap semiconductors
British Library Online Contents | 1995
|An electrostatically-focussed positron beam for surface studies
British Library Online Contents | 1999
|