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Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment
Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment
Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment
Coleman, V. A. (Autor:in) / Petravic, M. (Autor:in) / Kim, K. J. (Autor:in) / Kim, B. (Autor:in) / Li, G. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 3413-3416
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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