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Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment
Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment
Near-edge X-ray absorption fine-structure studies of GaN under low-energy nitrogen ion bombardment
Coleman, V. A. (author) / Petravic, M. (author) / Kim, K. J. (author) / Kim, B. (author) / Li, G. (author)
APPLIED SURFACE SCIENCE ; 252 ; 3413-3416
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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