Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
Egerhazi, L. (Autor:in) / Geretovszky, Z. (Autor:in) / Csako, T. (Autor:in) / Szorenyi, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 4661-4666
01.01.2006
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Thickness distribution of carbon nitride films grown by inverse-pulsed laser deposition
British Library Online Contents | 2005
|Homogeneous films by inverse pulsed laser deposition
British Library Online Contents | 2011
|Liquid crystal films grown by pulsed laser deposition
British Library Online Contents | 1999
|Atomic force microscope study of carbon thin films prepared by pulsed laser deposition
British Library Online Contents | 1999
|Synthesis and characterization of tungsten disulphide films grown by pulsed-laser deposition
British Library Online Contents | 1994
|