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Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition
Egerhazi, L. (author) / Geretovszky, Z. (author) / Csako, T. (author) / Szorenyi, T. (author)
APPLIED SURFACE SCIENCE ; 252 ; 4661-4666
2006-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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