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    Atomic force microscopic characterization of films grown by inverse pulsed laser deposition

    New search for: Egerhazi, L.
    New search for: Geretovszky, Z.
    New search for: Csako, T.
    New search for: Szorenyi, T.

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    Atomic force microscopic characterization of films grown by inverse pulsed laser deposition

    New search for: Egerhazi, L.
    New search for: Geretovszky, Z.
    New search for: Csako, T.
    New search for: Szorenyi, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Atomic force microscopic characterization of films grown by inverse pulsed laser deposition

    New search for: Egerhazi, L.
    New search for: Geretovszky, Z.
    New search for: Csako, T.
    New search for: Szorenyi, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Atomic force microscopic characterization of films grown by inverse pulsed laser deposition

    Contributors:

    Egerhazi, L. (author) / Geretovszky, Z. (author) / Csako, T. (author) / Szorenyi, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 4661-4666

    Publication date:

    2006-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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