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Avoiding ghost stress on reconstruction of stress- and composition-depth profiles from destructive X-ray diffraction depth profiling
Avoiding ghost stress on reconstruction of stress- and composition-depth profiles from destructive X-ray diffraction depth profiling
Avoiding ghost stress on reconstruction of stress- and composition-depth profiles from destructive X-ray diffraction depth profiling
Christiansen, T. (Autor:in) / Somers, M. A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 424 ; 181-189
01.01.2006
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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