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Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN
Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN
Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN
Khanna, R. (Autor:in) / Pearton, S. J. (Autor:in) / Ren, F. (Autor:in) / Kravchenko, I. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 5814-5819
01.01.2006
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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