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Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN
Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN
Annealing and measurement temperature dependence of W2B5-based rectifying contacts to n-GaN
Khanna, R. (author) / Pearton, S. J. (author) / Ren, F. (author) / Kravchenko, I. (author)
APPLIED SURFACE SCIENCE ; 252 ; 5814-5819
2006-01-01
6 pages
Article (Journal)
English
DDC:
621.35
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