Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior
Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior
Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior
Simpkins, B. S. (Autor:in) / Zhang, H. (Autor:in) / Yu, E. T. (Autor:in)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 308-314
01.01.2006
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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