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Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior
Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior
Defects in nitride semiconductors: From nanoscale imaging to macroscopic device behavior
Simpkins, B. S. (author) / Zhang, H. (author) / Yu, E. T. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 308-314
2006-01-01
7 pages
Article (Journal)
English
DDC:
621.38152
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