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Leaching of Lead from Discarded Notebook Computers Using the Scale-up TCLP and Other Standard Leaching Tests
Leaching of Lead from Discarded Notebook Computers Using the Scale-up TCLP and Other Standard Leaching Tests
Leaching of Lead from Discarded Notebook Computers Using the Scale-up TCLP and Other Standard Leaching Tests
Jang, Y.-C. (Autor:in) / Townsend, T. G. (Autor:in)
ENVIRONMENTAL ENGINEERING RESEARCH -SEOUL- ; 11 ; 14-27
01.01.2006
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
628
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