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Leaching of Lead from Discarded Notebook Computers Using the Scale-up TCLP and Other Standard Leaching Tests
Leaching of Lead from Discarded Notebook Computers Using the Scale-up TCLP and Other Standard Leaching Tests
Leaching of Lead from Discarded Notebook Computers Using the Scale-up TCLP and Other Standard Leaching Tests
Jang, Y.-C. (author) / Townsend, T. G. (author)
ENVIRONMENTAL ENGINEERING RESEARCH -SEOUL- ; 11 ; 14-27
2006-01-01
14 pages
Article (Journal)
English
DDC:
628
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