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Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations
Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations
Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations
Jenkins, M. L. (Autor:in) / Zhou, Z. (Autor:in) / Dudarev, S. L. (Autor:in) / Sutton, A. P. (Autor:in) / Kirk, M. A. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 41 ; 4445-4453
01.01.2006
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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