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Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

Jenkins, M. L. / Zhou, Z. / Dudarev, S. L. / Sutton, A. P. / Kirk, M. A.

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Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

Jenkins, M. L. / Zhou, Z. / Dudarev, S. L. / Sutton, A. P. / Kirk, M. A.

Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

Jenkins, M. L. / Zhou, Z. / Dudarev, S. L. / Sutton, A. P. / Kirk, M. A.

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Document information

Title:

Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

Contributors:

Jenkins, M. L. (author) / Zhou, Z. (author) / Dudarev, S. L. (author) / Sutton, A. P. (author) / Kirk, M. A. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 41 ; 4445-4453

Publication date:

2006-01-01

Size:

9 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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