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SIMS quantification of matrix and impurity species in AlxGa1-xN
SIMS quantification of matrix and impurity species in AlxGa1-xN
SIMS quantification of matrix and impurity species in AlxGa1-xN
Gu, C. J. (Autor:in) / Stevie, F. A. (Autor:in) / Hitzman, C. J. (Autor:in) / Saripalli, Y. N. (Autor:in) / Johnson, M. (Autor:in) / Griffis, D. P. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 7228-7231
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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