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    SIMS quantification of matrix and impurity species in AlxGa1-xN

    New search for: Gu, C. J.
    New search for: Stevie, F. A.
    New search for: Hitzman, C. J.
    New search for: Saripalli, Y. N.
    New search for: Johnson, M.
    New search for: Griffis, D. P.

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    SIMS quantification of matrix and impurity species in AlxGa1-xN

    New search for: Gu, C. J.
    New search for: Stevie, F. A.
    New search for: Hitzman, C. J.
    New search for: Saripalli, Y. N.
    New search for: Johnson, M.
    New search for: Griffis, D. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    SIMS quantification of matrix and impurity species in AlxGa1-xN

    New search for: Gu, C. J.
    New search for: Stevie, F. A.
    New search for: Hitzman, C. J.
    New search for: Saripalli, Y. N.
    New search for: Johnson, M.
    New search for: Griffis, D. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    SIMS quantification of matrix and impurity species in AlxGa1-xN

    Contributors:

    Gu, C. J. (author) / Stevie, F. A. (author) / Hitzman, C. J. (author) / Saripalli, Y. N. (author) / Johnson, M. (author) / Griffis, D. P. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 7228-7231

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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