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Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique
Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique
Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique
Kadys, A. (Autor:in) / Sudzius, M. (Autor:in) / Jarasiunas, K. (Autor:in) / Mao, L. (Autor:in) / Sun, N. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 133 ; 136-140
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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