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    Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique

    New search for: Kadys, A.
    New search for: Sudzius, M.
    New search for: Jarasiunas, K.
    New search for: Mao, L.
    New search for: Sun, N.

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    Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique

    New search for: Kadys, A.
    New search for: Sudzius, M.
    New search for: Jarasiunas, K.
    New search for: Mao, L.
    New search for: Sun, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique

    New search for: Kadys, A.
    New search for: Sudzius, M.
    New search for: Jarasiunas, K.
    New search for: Mao, L.
    New search for: Sun, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Nondestructive evaluation of differently doped InP wafers by time-resolved four-wave mixing technique

    Contributors:

    Kadys, A. (author) / Sudzius, M. (author) / Jarasiunas, K. (author) / Mao, L. (author) / Sun, N. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 133 ; 136-140

    Publication date:

    2006-01-01

    Size:

    5 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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