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Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4
Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4
Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4
Ching, W. Y. (Autor:in) / Chen, J. (Autor:in) / Rulis, P. (Autor:in) / Ouyang, L. (Autor:in) / Misra, A. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 41 ; 5061-5067
01.01.2006
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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