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    Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4

    New search for: Ching, W. Y.
    New search for: Chen, J.
    New search for: Rulis, P.
    New search for: Ouyang, L.
    New search for: Misra, A.

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    Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4

    New search for: Ching, W. Y.
    New search for: Chen, J.
    New search for: Rulis, P.
    New search for: Ouyang, L.
    New search for: Misra, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4

    New search for: Ching, W. Y.
    New search for: Chen, J.
    New search for: Rulis, P.
    New search for: Ouyang, L.
    New search for: Misra, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Ab initio modeling of clean and Y-doped grain boundaries in alumina and intergranular glassy films (IGF) in β-Si3N4

    Contributors:

    Ching, W. Y. (author) / Chen, J. (author) / Rulis, P. (author) / Ouyang, L. (author) / Misra, A. (author)

    Published in:

    JOURNAL OF MATERIALS SCIENCE ; 41 ; 5061-5067

    Publication date:

    2006-01-01

    Size:

    7 pages

    ISSN:

    0022-2461

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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