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Characterization of post-copper CMP surfaces with scanning probe microscopy
Characterization of post-copper CMP surfaces with scanning probe microscopy
Characterization of post-copper CMP surfaces with scanning probe microscopy
Dominget, A. (Autor:in) / Farkas, J. (Autor:in) / Szunerits, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 7760-7765
01.01.2006
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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