Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures
Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures
Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures
Hosea, T. J. (Autor:in) / Cripps, S. A. (Autor:in) / Sale, T. E. (Autor:in) / Hild, K. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 70-79
01.01.2006
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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