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    Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures

    New search for: Hosea, T. J.
    New search for: Cripps, S. A.
    New search for: Sale, T. E.
    New search for: Hild, K.

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    Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures

    New search for: Hosea, T. J.
    New search for: Cripps, S. A.
    New search for: Sale, T. E.
    New search for: Hild, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures

    New search for: Hosea, T. J.
    New search for: Cripps, S. A.
    New search for: Sale, T. E.
    New search for: Hild, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures

    Contributors:

    Hosea, T. J. (author) / Cripps, S. A. (author) / Sale, T. E. (author) / Hild, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 253 ; 70-79

    Publication date:

    2006-01-01

    Size:

    10 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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