Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes
Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes
Nanoscale Deep Level Defect Correlation with Schottky Barriers in 4H-SiC/Metal Diodes
Tumakha, S. P. (Autor:in) / Porter, L. M. (Autor:in) / Ewing, D. J. (Autor:in) / Wahab, Q. (Autor:in) / Ma, X. Y. (Autor:in) / Sudarshan, T. S. (Autor:in) / Brillson, L. J. (Autor:in) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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