Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
On Separating Oxide Charges and Interface Charges in 4H-SiC Metal-Oxide-Semiconductor Devices
On Separating Oxide Charges and Interface Charges in 4H-SiC Metal-Oxide-Semiconductor Devices
On Separating Oxide Charges and Interface Charges in 4H-SiC Metal-Oxide-Semiconductor Devices
Habersat, D. B. (Autor:in) / Lelis, A. J. (Autor:in) / Lopez, G. (Autor:in) / McGarrity, J. M. (Autor:in) / McLean, F. B. (Autor:in) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
Silicon Carbide and Related Materials - 2005 ; 1007-1010
MATERIALS SCIENCE FORUM ; 527/529
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Trapping of photogenerated charges in oxide nanoparticles
British Library Online Contents | 2005
|British Library Online Contents | 1997
|Chemical bonding analysis of alkali oxide glass systems: charges on metal ions
British Library Online Contents | 1995
|Emerald Group Publishing | 2000
Engineering Index Backfile | 1941
|