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`Switch-Back Epitaxy' as a Novel Technique for Reducing Stacking Faults in 3C-SiC
`Switch-Back Epitaxy' as a Novel Technique for Reducing Stacking Faults in 3C-SiC
`Switch-Back Epitaxy' as a Novel Technique for Reducing Stacking Faults in 3C-SiC
Yagi, K. (Autor:in) / Kawahara, T. (Autor:in) / Hatta, N. (Autor:in) / Nagasawa, H. (Autor:in) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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