Effect of post-annealing temperature on the microstructure and magnetic properties of Ce:YIG thin films deposited on Si substrates: Fid-Bau Portal

Effect of post-annealing temperature on the microstructure and magnetic properties of Ce:YIG thin films deposited on Si substrates

Zhou, X. / Cheng, W. / Lin, F. / Ma, X. / Shi, W.

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Effect of post-annealing temperature on the microstructure and magnetic properties of Ce:YIG thin films deposited on Si substrates

Zhou, X. / Cheng, W. / Lin, F. / Ma, X. / Shi, W.

Effect of post-annealing temperature on the microstructure and magnetic properties of Ce:YIG thin films deposited on Si substrates

Zhou, X. / Cheng, W. / Lin, F. / Ma, X. / Shi, W.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Dokumentinformationen

Ähnliche Titel

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Dokumentinformationen

Titel:

Effect of post-annealing temperature on the microstructure and magnetic properties of Ce:YIG thin films deposited on Si substrates

Beteiligte:

Zhou, X. (Autor:in) / Cheng, W. (Autor:in) / Lin, F. (Autor:in) / Ma, X. (Autor:in) / Shi, W. (Autor:in)

Erschienen in:

APPLIED SURFACE SCIENCE ; 253 ; 2108-2112

Erscheinungsdatum:

01.01.2006

Format / Umfang:

5 pages

ISSN:

0169-4332

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 621.35

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