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An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy
An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy
An Analytical Model for Electrically Actuated Scanning Probe in Electrostatic Force Microscopy
Wang, H. X. (Autor:in) / Zhao, J. (Autor:in) / Jia, J. Y. (Autor:in) / Jiang, C. / Liu, G. / Zhang, D. / Xu, X.
01.01.2007
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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