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Experimental and Simulation Research on Influence of Temperature on Nano-Scratching Process of Silicon Wafer
Experimental and Simulation Research on Influence of Temperature on Nano-Scratching Process of Silicon Wafer
Experimental and Simulation Research on Influence of Temperature on Nano-Scratching Process of Silicon Wafer
Okabe, H. (Autor:in) / Tsumura, T. (Autor:in) / Shimizu, J. (Autor:in) / Zhou, L. (Autor:in) / Eda, H. (Autor:in) / Guo, D. / Kuriyagawa, T. / Wang, J. / Tamaki, J.
01.01.2007
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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