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Quantitative analysis of surface amine groups on plasma-polymerized ethylenediamine films using UV-visible spectroscopy compared to chemical derivatization with FT-IR spectroscopy, XPS and TOF-SIMS
Quantitative analysis of surface amine groups on plasma-polymerized ethylenediamine films using UV-visible spectroscopy compared to chemical derivatization with FT-IR spectroscopy, XPS and TOF-SIMS
Quantitative analysis of surface amine groups on plasma-polymerized ethylenediamine films using UV-visible spectroscopy compared to chemical derivatization with FT-IR spectroscopy, XPS and TOF-SIMS
Kim, J. (Autor:in) / Jung, D. (Autor:in) / Park, Y. (Autor:in) / Kim, Y. (Autor:in) / Moon, D. W. (Autor:in) / Lee, T. G. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 4112-4118
01.01.2007
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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Chemical derivatization technique in ToF-SIMS for quantification analysis of surface amine groups
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