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Quantitative analysis of surface amine groups on plasma-polymerized ethylenediamine films using UV-visible spectroscopy compared to chemical derivatization with FT-IR spectroscopy, XPS and TOF-SIMS
Quantitative analysis of surface amine groups on plasma-polymerized ethylenediamine films using UV-visible spectroscopy compared to chemical derivatization with FT-IR spectroscopy, XPS and TOF-SIMS
Quantitative analysis of surface amine groups on plasma-polymerized ethylenediamine films using UV-visible spectroscopy compared to chemical derivatization with FT-IR spectroscopy, XPS and TOF-SIMS
Kim, J. (author) / Jung, D. (author) / Park, Y. (author) / Kim, Y. (author) / Moon, D. W. (author) / Lee, T. G. (author)
APPLIED SURFACE SCIENCE ; 253 ; 4112-4118
2007-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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Chemical derivatization technique in ToF-SIMS for quantification analysis of surface amine groups
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