Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy
Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy
Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy
Pezzotti, G. (Autor:in) / Anglada, M. / Jimenez-Pique, E. / Hvizdos, P.
01.01.2007
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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