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    Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy

    New search for: Pezzotti, G.
    New search for: Anglada, M.
    New search for: Jimenez-Pique, E.
    New search for: Hvizdos, P.

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    Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy

    New search for: Pezzotti, G.
    New search for: Anglada, M.
    New search for: Jimenez-Pique, E.
    New search for: Hvizdos, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy

    New search for: Pezzotti, G.
    New search for: Anglada, M.
    New search for: Jimenez-Pique, E.
    New search for: Hvizdos, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Quantitative Assessment of Crack-Tip Stress Field in Semiconductor GaN Using Electrostimulated Piezo-Spectroscopy

    Contributors:

    Pezzotti, G. (author) / Anglada, M. / Jimenez-Pique, E. / Hvizdos, P.

    Published in:

    Layered, Functional Gradient Ceramics, and Thermal Barrier Coatings: Design, Fabrication and Applications ; 127-136

    KEY ENGINEERING MATERIALS ; 333

    Publication date:

    2007-01-01

    Size:

    10 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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