Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Effect of Substrate Bias Voltage on the Microstructural and Mechanical Properties of TiN-Coated HSS Synthesized by CAPVD Technique
Effect of Substrate Bias Voltage on the Microstructural and Mechanical Properties of TiN-Coated HSS Synthesized by CAPVD Technique
Effect of Substrate Bias Voltage on the Microstructural and Mechanical Properties of TiN-Coated HSS Synthesized by CAPVD Technique
Mubarak, A. (Autor:in) / Hamzah, E. (Autor:in) / Toff, M. R. M. (Autor:in)
SURFACE REVIEW AND LETTERS ; 13 ; 621-634
01.01.2006
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
530.417
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Transport and storage properties of CrSi2/Si junctions made using the CAPVD technique
British Library Online Contents | 2010
|British Library Online Contents | 2007
|British Library Online Contents | 2014
|Microstructural and mechanical properties of Al-base coated EUROFER-97
Elsevier | 2024
|