Electronic structure of stressed CrSi2

Krivosheeva, A. V. / Shaposhnikov, V. L. / Borisenko, V. E. | British Library Online Contents | 2003

Effect of Substrate Bias Voltage on the Microstructural and Mechanical Properties of TiN-Coated HSS Synthesized by CAPVD Technique

Mubarak, A. / Hamzah, E. / Toff, M. R. M. | British Library Online Contents | 2006

Structure of thin CrSi2 films on Si(001)

Filonenko, O. / Falke, M. / Hortenbach, H. et al. | British Library Online Contents | 2004

Deposition and Characterization of TiN-Coated Steels at Various N~2 Gas Flow Rates with Constant Etching by Using CAPVD Technique

Mubarak, A. / Hamzah, E. / Toff, M. R. M. | British Library Online Contents | 2007

Migration of CrSi2 nanocrystals through nanopipes in the silicon cap

Galkin, N. G. / Dozsa, L. / Chusovitin, E. A. et al. | British Library Online Contents | 2010