Nanostructural C-Al-N thin films studied by x-ray photoelectron spectroscopy, Raman and high-resolution transmission electron microscopy

Han, Y.F. / Fu, T. / Shen, Y.G. | British Library Online Contents | 2009

Transmission electron microscopy and high-resolution transmission electron microscopy study of nanostructure and metastable phase Evolution in pulsed-laser-ablation-deposited Ti-Si thin film

Bysakh, S. / Mitsuishi, K. / Song, M. et al. | British Library Online Contents | 2004

Microtexture and structure of boron nitride fibres by transmission electron microscopy, X-ray diffraction, photoelectron spectroscopy and Raman scattering

Vincent, H. / Chassagneux, F. / Vincent, C. et al. | British Library Online Contents | 2003

High-resolution photoelectron yield spectroscopy of oxide superconductors

Kawasaki, M. / Ohashi, S. / Kitajima, T. et al. | British Library Conference Proceedings | 1996

Characterization of ferroelectric ceramics using x-ray diffraction, transmission electron microscopy, and x-ray photoelectron spectroscopy

Kim, J.-N. / Shin, K.-S. / Park, B.-O. et al. | British Library Online Contents | 2003