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A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All Around MOSFETs
A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All Around MOSFETs
A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All Around MOSFETs
Djeffal, F. (Autor:in) / Abdi, M. A. (Autor:in) / Dibi, Z. (Autor:in) / Chahdi, M. (Autor:in) / Benhaya, A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 147 ; 239-244
01.01.2008
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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