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Quantitative atomic force microscopy analysis of slip traces in Ni3Al yield stress anomaly
Quantitative atomic force microscopy analysis of slip traces in Ni3Al yield stress anomaly
Quantitative atomic force microscopy analysis of slip traces in Ni3Al yield stress anomaly
Bonneville, J. (Autor:in) / Coupeau, C. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 483/484 ; 87-90
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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