Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon
Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon
Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon
Plusnin, N.I. (Autor:in) / Il yashenko, W.M. (Autor:in) / Kitan, S.A. (Autor:in) / Krylov, S.V. (Autor:in) / Gao, W. / Takaya, Y. / Gao, Y. / Krystek, M.
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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