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Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon
Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon
Development of Nanometrology for Nanoelectronics: Growth and Characterization of Transition Metal Monolayer Films on Silicon
Plusnin, N.I. (author) / Il yashenko, W.M. (author) / Kitan, S.A. (author) / Krylov, S.V. (author) / Gao, W. / Takaya, Y. / Gao, Y. / Krystek, M.
2008-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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