Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
Oliver, R.A. (Autor:in) / Galtrey, M.J. (Autor:in) / Humphreys, C.J. (Autor:in) / Cerezo, A. / Cockayne, D.
01.01.2008
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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