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High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems
Oliver, R.A. (author) / Galtrey, M.J. (author) / Humphreys, C.J. (author) / Cerezo, A. / Cockayne, D.
2008-01-01
7 pages
Article (Journal)
English
DDC:
620.11
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