Determination of interface state density distribution and surface recombination velocity on passivated semiconductor surfaces by photoluminescence surface state spectroscopy

Saitoh, T. / Hasegawa, H. | British Library Online Contents | 1995

The rate of surface generation of charge carriers at the semiconductor-glass interface

Vlasov, S. I. / Ovsyannikov, A. V. | British Library Online Contents | 2008

Semiconductor surface and interface passivation by cyanide treatment

Kobayashi, H. / Takahashi, M. / Maida, O. et al. | British Library Online Contents | 2004

Low Interface State Density Oxides on P-Type SiC

Lipkin, L. A. / Slater, D. B. / Palmour, J. W. | British Library Online Contents | 1998

Atomically controlled surface and interface, and semiconductor device performance

Sugano, T. | British Library Online Contents | 1992