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Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Min, H. (Autor:in) / Jung, G. (Autor:in) / Moon, D. W. (Autor:in) / Choi, I. S. (Autor:in) / Lee, T. G. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 1037-1039
01.01.2008
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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