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Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Min, H. (author) / Jung, G. (author) / Moon, D. W. (author) / Choi, I. S. (author) / Lee, T. G. (author)
APPLIED SURFACE SCIENCE ; 255 ; 1037-1039
2008-01-01
3 pages
Article (Journal)
English
DDC:
621.35
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